Xstress Series

Designed for residual stress and retained austenite measurements

The Xstress series offers portable and stationary X‑ray diffractometers designed to measure residual stress and retained austenite using a non‑destructive diffraction technique. These systems deliver unmatched reliability and accuracy for quality control, industrial process monitoring and research, providing fast measurements with 2D detectors and advanced analysis features. Modular designs allow you to upgrade instruments with rotation units, retained‑austenite modules and mapping kits as your needs evolve.

Xstress DR45 is the most advanced X-ray diffractometer on market for residual stress measurement.

A versatile diffractometer equipped with dual 2D detectors and an automated rotation unit for multi‑direction residual stress measurement. Ideal for quality control, process monitoring and research experiments.

Stresstech offers the Xstress DR45 in two models:

• Xstress DR45 1D: A high-accuracy version using a one-dimensional detector for detailed stress analysis.
• Xstress DR45 2D: A fast and versatile model equipped with a two-dimensional detector for multi-directional measurements.

Compact X-ray diffractometer for residual stress measurement in both field and laboratory use.

The Xstress DR45 S is a compact and versatile X-ray diffractometer tailored for residual stress measurement in both lab and field environments.
It’s offered in two simple models to match your needs:

• Xstress DR45 S 1D: Uses a 1D detector; a robust base-level system for quality control and research focusing on single‐direction measurements.
• Xstress DR45 S 2D: Equipped with a 2D detector; delivers faster results and is optimized for challenging materials or complex geometries.

Experience the future of residual stress measurement — fast, accurate, and fully automated with the Xstress Robot.

• Non-destructive
• Accurate 6-axis industrial robot (additional axis possible as an option)
• Automatic mapping on complicated parts, such as turbine blade is possible
• Movable or fixed installation with safety enclosure
• Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
• Three measurement distances as standard: 50, 75 and 100 mm
• Two NMOS position sensitive detectors
  Instantly adjustable 2θ-angle
• XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional)
• d-sin²χ and Ω-measurement modes as a standard

Fast. Accurate. Fully Automated Residual Stress Depth Measurement.

The Xstress Profile system is Stresstech’s automated X-ray diffraction solution for residual stress depth profiling.
It combines precision engineering with user-friendly automation to measure residual stress and retained austenite as a function of depth — quickly, repeatably, and without operator dependency.

Designed for both laboratory and production environments, the system integrates sample material removal, X-ray diffraction, and data analysis into one seamless process. This makes it ideal for applications that require layer-by-layer stress mapping, such as surface-treated, shot-peened, or machined components.

Secure, enclosed X-ray measurement solutions designed for precision and safety.

The Xstress Cabinet is a fully-enclosed safety solution designed to accompany the Xstress DR45 diffractometer, providing a secure and controlled environment for X-ray diffraction measurements.
Stresstech offers this cabinet to ensure full compliance with safety standards while enabling advanced residual stress measurement setups.